Agilent 5991-2907EN Electromagnetic Simulations at the Nanoscale EMPro Modeling and Comparison to SMM Exper free download

File name 5991-2907EN Electromagnetic Simulations at the Nanoscale_ EMPro Modeling and Comparison to SMM Exper

Keysight Technologies Electromagnetic Simulations at the Nanoscale: EMPro Modeling and Comparison to SMM Experiments Application Note Introduction n this application note, we describe electromagnetic (EM) simulations using Keysight Technologies' EMPro software1 to support the interpretation of scanning microwave microscope (SMM) experiments. The SMM is a new scanning probe microscope that combines the electromagnetic measurement capabilities of a microwave Performance Network Analyzer (PNA) with the nanometer-resolution and Angstrom-scale positioning capabilities of an atomic force microscope (AFM). Scanning microwave microscopy is a technique for measuring reflection scattering parameters and corresponding electric properties of materials at the nanoscale in the frequency range of 1